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Solution Proposal from Mitutoyo

Semiconductor Parts Evaluation

Demand for electronic devices and semiconductor packages is rising, driven by advancements in IoT, automotive CASE, and 5G communications. This growth is accompanied by an increasing need for precise dimensional measurement to ensure reliability.

In 3D packaging technology, which is gaining attention alongside semiconductor thinning advancements, high-precision dimensional measurements are crucial for accurate mounter positioning and assessing RDL lamination deviations.

To meet these needs, we introduce the most suitable models tailored for each application.

 

Previous Process Applications

  • A/N MARK (SEMI standard): Width, position, dot diameter and depth

  • Parts for CVD equipment: Shower head nozzle holes (Inner diameter, roundness, and position)

  • Parts for CVD equipment: Ceramic heater, silicon ring (Flatness, profile analysis, surface roughness)

  • Parts for CMP equipment: Polishing pad (Groove width, groove depth, groove pitch, and surface roughness)

  • Parts for etching equipment: Electrostatic chuck, silicon ring (Flatness, cross-sectional shape, surface roughness)

Post-Process Applications

  • Lead frame (Width, pitch, height, twist, etc.)

  • Wire loop height

  • Parts for CVD equipment: Ceramic heater, silicon ring (Flatness, profile analysis, surface roughness)

  • Lead width, pitch, height variance, clearance

  • Solder ball height, diameter, pitch

  • Package board coplanarity

Need help solving a measurement problem? Contact us anytime!

Related Solutions and Applications

Quick Vision Pro Series - General-Purpose CNC Vision Measuring System

The Quick Vision Pro delivers exceptional performance with versatile models featuring touch probes and non-contact displacement sensors, providing robust support for increased production demands.

Hyper Quick Vision WLI Series - Non-Contact 3D Measuring System

The Hyper Quick Vision WLI integrates vision measurement with white light interferometry, providing precise, non-contact coordinate and nano-level 3D form measurements in a single unit—perfect for mass-producing next-generation micropatterns in electronic devices.

CRYSTA-Apex V - General-Purpose CNC Coordinate Measuring Machine

The CRYSTA-Apex V is a standard accuracy, high-speed CNC coordinate measuring machine designed for versatile dimensional and geometric tolerance measurements, offering improved productivity and enhanced visualization within a single unit.

Measuring Microscope
MF/MF-U Series

A highly expandable measuring microscope capable of high-speed electric focusing. Extensive lineup available

Surface Measuring Machine
FORMTRACER Avant Series

A stationary model that pursues high measurement efficiency and safety. By replacing the detector, surface roughness and contour measurements can be performed in one unit.

Non-contact sensor for built-in equipment
LSM series

Wide range of measurement range and resolution available

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Mitutoyo Corporation

© 2025 Mitutoyo America Corporation.

All rights reserved.